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Toshiba HK4R Series SSD: wrong Total_LBAs_Written unit (should be 32 MiB) #312
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I've found it in { "Toshiba HK4R Series SSD", // TOSHIBA THNSN8960PCSE/8EET6101
"TOSHIBA THNSN8(120P|240P|480P|960P|1Q92)CSE",
"", "",
"-v 167,raw48,SSD_Protect_Mode "
"-v 168,raw48,SATA_PHY_Error_Count "
"-v 169,raw48,Bad_Block_Count "
"-v 173,raw48,Erase_Count "
"-v 241,raw48,Total_32MiBs_Written "
"-v 242,raw48,Total_32MiBs_Read "
}, Should/could I create a pull request for this change? |
Thanks for the info. Please provide a full This repo is still a R/O mirror of the upstream SVN repo at SF. So please add a patch for the |
So first here is the requested output: # smartctl -q noserial -a -x /dev/ada0
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba HK4R Series SSD
Device Model: TOSHIBA THNSN81Q92CSE
Firmware Version: 8ENP6101
User Capacity: 1,920,383,410,176 bytes [1.92 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5625
ATA Version is: ACS-3 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Jan 2 22:22:30 2025 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 67) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 19519
10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
12 Power_Cycle_Count -O--C- 100 100 000 - 20
167 SSD_Protect_Mode -O---K 100 100 000 - 0
168 SATA_PHY_Error_Count -O--C- 100 100 000 - 0
169 Bad_Block_Count PO--C- 100 100 010 - 100
170 Unknown_Attribute PO--C- 100 100 010 - 0
173 Erase_Count -O--C- 199 199 000 - 4295973152
174 Unknown_Attribute -O--C- 200 200 000 - 371679
175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 17
194 Temperature_Celsius -O---K 067 062 000 - 33 (Min/Max 19/38)
197 Current_Pending_Sector -O--C- 100 100 000 - 0
232 Available_Reservd_Space -O---K 100 100 000 - 0
240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
241 Total_32MiBs_Written -O--C- 100 100 000 - 1236186
242 Total_32MiBs_Read -O--C- 100 100 000 - 1290562
243 Unknown_Attribute -O--C- 100 100 000 - 9
249 Unknown_Attribute -O---K 100 100 000 - 99027
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x24 GPL R/O 1536 Current Device Internal Status Data log
0x25 GPL R/O 49216 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 19517 -
# 2 Extended offline Completed without error 00% 19516 -
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 19517 -
# 2 Extended offline Completed without error 00% 19516 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 3 (0x0003)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 28/36 Celsius
Lifetime Min/Max Temperature: 19/38 Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
00 00 04 00 05 01 00 05 05 00 00 00 00 00 00 00
00 02 00 00 e7 3c 30 04 04 04 00 00 00 00 00 0b
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/55 Celsius
Min/Max Temperature Limit: 0/80 Celsius
Temperature History Size (Index): 128 (66)
Index Estimated Time Temperature Celsius
67 2025-01-02 20:15 31 ************
... ..( 7 skipped). .. ************
75 2025-01-02 20:23 31 ************
76 2025-01-02 20:24 30 ***********
... ..( 15 skipped). .. ***********
92 2025-01-02 20:40 30 ***********
93 2025-01-02 20:41 31 ************
94 2025-01-02 20:42 32 *************
95 2025-01-02 20:43 31 ************
... ..( 11 skipped). .. ************
107 2025-01-02 20:55 31 ************
108 2025-01-02 20:56 ? -
109 2025-01-02 20:57 26 *******
110 2025-01-02 20:58 27 ********
111 2025-01-02 20:59 27 ********
112 2025-01-02 21:00 28 *********
... ..( 3 skipped). .. *********
116 2025-01-02 21:04 28 *********
117 2025-01-02 21:05 29 **********
... ..( 5 skipped). .. **********
123 2025-01-02 21:11 29 **********
124 2025-01-02 21:12 30 ***********
... ..( 45 skipped). .. ***********
42 2025-01-02 21:58 30 ***********
43 2025-01-02 21:59 ? -
44 2025-01-02 22:00 28 *********
45 2025-01-02 22:01 29 **********
... ..( 2 skipped). .. **********
48 2025-01-02 22:04 29 **********
49 2025-01-02 22:05 30 ***********
... ..( 7 skipped). .. ***********
57 2025-01-02 22:13 30 ***********
58 2025-01-02 22:14 31 ************
59 2025-01-02 22:15 31 ************
60 2025-01-02 22:16 32 *************
61 2025-01-02 22:17 34 ***************
62 2025-01-02 22:18 35 ****************
63 2025-01-02 22:19 36 *****************
64 2025-01-02 22:20 34 ***************
65 2025-01-02 22:21 33 **************
66 2025-01-02 22:22 33 **************
SCT Error Recovery Control:
Read: 600 (60.0 seconds)
Write: 600 (60.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 20 --- Lifetime Power-On Resets
0x01 0x010 4 19519 --- Power-on Hours
0x01 0x018 6 81014714909 --- Logical Sectors Written
0x01 0x020 6 1353232484 --- Number of Write Commands
0x01 0x028 6 84578324311 --- Logical Sectors Read
0x01 0x030 6 687606726 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4
8000
0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 33 --- Current Temperature
0x05 0x010 1 28 --- Average Short Term Temperature
0x05 0x018 1 28 --- Average Long Term Temperature
0x05 0x020 1 32 --- Highest Temperature
0x05 0x028 1 22 --- Lowest Temperature
0x05 0x030 1 29 --- Highest Average Short Term Temperature
0x05 0x038 1 22 --- Lowest Average Short Term Temperature
0x05 0x040 1 28 --- Highest Average Long Term Temperature
0x05 0x048 1 23 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 5 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 133 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 3 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 4 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC |
And here is a check of # smartctl -q noserial -x /dev/ada0 | grep 'Logical Sectors'
0x01 0x018 6 81014979981 --- Logical Sectors Written
0x01 0x028 6 84578324607 --- Logical Sectors Read
# dd if=/dev/zero of=/dev/ada0 bs=4k count=1
1+0 records in
1+0 records out
4096 bytes transferred in 0.003631 secs (1128098 bytes/sec)
# smartctl -q noserial -x /dev/ada0 | grep 'Logical Sectors'
0x01 0x018 6 81014979989 --- Logical Sectors Written
0x01 0x028 6 84578324755 --- Logical Sectors Read
# dd if=/dev/zero of=/dev/ada0 bs=32m count=1
1+0 records in
1+0 records out
33554432 bytes transferred in 0.086356 secs (388558018 bytes/sec)
# smartctl -q noserial -x /dev/ada0 | grep 'Logical Sectors'
0x01 0x018 6 81015045525 --- Logical Sectors Written
0x01 0x028 6 84578324903 --- Logical Sectors Read |
Hi,
my Toshiba HK4R Series SSDs report wrong values for Total_LBAs_Written:
Info:
# smartctl -q noserial -i /dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Toshiba HK4R Series SSD Device Model: TOSHIBA THNSN81Q92CSE Firmware Version: 8ENP6101 User Capacity: 1,920,383,410,176 bytes [1.92 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5625 ATA Version is: ACS-3 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Jan 1 12:33:12 2025 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled
Sector size is reported as 512 byte (as usual):
# smartctl -q noserial -i /dev/ada0 | grep "Sector Size" Sector Size: 512 bytes logical/physical
But the unit of
Total_LBAs_Written
apparantly is 32 MiB:I've also noticed that CrystalDiskInfo shows other values and I've found this: https://github.com/hiyohiyo/CrystalDiskInfo/blob/bdf4e44cc449225ec814c011c5d6c537da3c71fc/AtaSmart.cpp#L5579
They are setting the unit for specific Toshiba SSDs to 32 MiB and to 1 GiB for others:
Could it be renamed to
Total_32MiBs_Written
in drivedb?The text was updated successfully, but these errors were encountered: